Wanted: JEOL JSM-6460

Wanted: JEOL JSM-6460
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Manufacturer:  Jeol

WANTED: JEOL JSM 6460 Scanning Electron Microscope (SEM) with Oxford INCA Energy EDS system and MICS Microscope Image Capture System is a high-performance versatile SEM. The high-precision electron optical system incorporated in this SEM is effectively used with the large flexible specimen chamber that accommodates a 200mm diameter specimen. The easy-to-understand, easy-to-use operation GUI is developed for multi-user environment.
  • Magnification (X): 5 to 300000
  • Resolution (nm): 3.00
  • Accelerating Voltage (kilovolts): 0 to 30
  • Digital Display
  • Computer Interface
  • Optimized for fitting and integrating X-ray spectrometers
Please contact us for complete instrument, warranty and service contract details.

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