Features: Environmental / Low Vacuum; Digital Display. Low pressure neutralizes charge on uncoated, non-conducting materials. It is a fully digital instrument that can view specimens by secondary electron imaging (SEI), backscatter electron imaging (BEI), at high vacuum, or at low vacuum. The low vacuum mode, using the backscatter electron detector, allows viewing of certain specimens that have not been fixed, critical-point-dried, or sputter coated. A cryostub allows a specimen snap-frozen in liquid nitrogen to be viewed, allowing the sample to be viewed in its native state. The digital images produced by this instrument are easily assembled into plates and have detailed information files containing all operational parameters associated with the image files. Please contact us with complete Jeol SEM instrument details. (JSM 6360LV/JSM6360LV)